Recherche de compromis coût/qualité dans un processus de synthèse en vue de la testabilité
答辩 : 2000-9-28
离开日期 : 2000-10-1
1998-2001 刊物
2001
P. Bukovjan, L. Ducerf‑Bourbon, M. Marzouki : “Cost/Quality Trade-Off in Synthesis for BIST”, Journal of Electronic Testing: : Theory and Applications, vol. 17 (2), pp. 109-119, (Springer Verlag) (2001)
P. Bukovjan, L. Ducerf‑Bourbon, M. Marzouki : “Cost/Quality Trade-off in Synthesis for Scan”, 3rd International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Slomenice, Slovakia (2000)
P. Bukovjan, L. Ducerf‑Bourbon, M. Marzouki : “Cost/Quality Trade-off in Synthesis for BIST”, 1st IEEE Latin America Test Workshop (LATW), Rio de Janeiro, Brazil, pp. 110-115 (2000)