Th. Spyrou, Y. Biyani, K. Stavrakakis, R. Bishnoi, S. Hamdioui, J. Lopez, L. Dumas, J. Coignus, D. Ly, H. Chazot‑Ranquet, L. Grenouillet, F. Grimaud, S. Martin, O. Billoint, F. Andrieu, R. Alcala, S. Slesazeck, A. Sunil, Ch. Peng, A. Cauquil, R. Pronsato, D. Deleruyelle, C. Marchand, A. Bosio, I. O’connor, G. Urlini, S. Jeannot, M. Alvar, N. Moghaddam, Th. Werner, T. Schenk, B. Cheng, M. Khoei, L. Ramírez, E. Koh, S. Kale, N. Barrett : “Multi-Partner Project: Scalable, Ferroelectric-based Accelerators for Energy Efficient Edge AI (Ferro4EdgeAI)”, 2026 Design, Automation & Test in Europe Conference (DATE), Verona, Italy, pp. 1-7, (IEEE), (ISBN: 978-3-9826741-1-7) (2026)
Th. Spyrou, Haralampos‑G. Stratigopoulos : “On-Line Testing of Neuromorphic Hardware”, 2023 IEEE European Test Symposium (ETS), Venise, Italy, pp. 1-6, (IEEE), (ISBN: 979-8-3503-3634-4) (2023)
S. El‑Sayed, Th. Spyrou, L. Camuñas‑Mesa, Haralampos‑G. Stratigopoulos : “Compact Functional Testing for Neuromorphic Computing Circuits”, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 42 (7), pp. 2391-2403, (IEEE) (2023)
2022
Th. Spyrou, S. El‑Sayed, E. Afacan, L. Camuñas‑Mesa, B. Linares‑Barranco, Haralampos‑G. Stratigopoulos : “Reliability Analysis of a Spiking Neural Network Hardware Accelerator”, Design, Automation and Test in Europe Conference (DATE), Antwerp, Belgium, pp. 370-375, (IEEE) (2022)
2021
Th. Spyrou, S. El‑Sayed, E. Afacan, L. Camuñas‑Mesa, B. Linares‑Barranco, Haralampos‑G. Stratigopoulos : “Neuron Fault Tolerance in Spiking Neural Networks”, 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), Grenoble (virtuel), France, pp. 743-748, (IEEE) (2021)
2020
S. El‑Sayed, Th. Spyrou, A. Pavlidis, E. Afacan, L. Camuñas‑Mesa, B. Linares‑Barranco, Haralampos‑G. Stratigopoulos : “Spiking Neuron Hardware-Level Fault Modeling”, 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), Naples, Italy (2020)