Aide à la conception de systèmes testables

1997-2001 Publications

• 2001
  • M. Benabdenbi, W. Maroufi, M. Marzouki : “Testing TAPed Cores and Wrapped Cores With The Same Test Access Mechanism”, DATE 2001 - IEEE Design Automation and Test in Europe, Munich, Germany, pp. 150-155, (IEEE) (2001)
• 2000
  • W. Maroufi, M. Benabdenbi, M. Marzouki : “Solving the I/O Bandwidth Problem in System on a Chip Testing”, XIII Symposium on Integrated Circuits and Systems Design (SBCCI'00), Manaus, Brazil, pp. 9-14, (IEEE) (2000)
  • W. Maroufi, M. Benabdenbi, M. Marzouki : “Controlling the CAS-BUS TAM with IEEE 1149.1 TAP: A Solution for Systems-On-a-Chip Testing”, 4^th IEEE International Workshop on Testing Embedded Core-based Systems (TECS'00), Montréal, Canada (2000)
  • M. Benabdenbi, W. Maroufi, M. Marzouki : “CAS-BUS: A Scalable and Reconfigurable Test Access Mechanism for Systems on a Chip”, Design Automation and Test in Europe Conference (DATE'2000), Paris, France, pp. 141-145, (IEEE) (2000)
• 1999
  • W. Maroufi : “Aide à la conception de systèmes testables”, thesis, phd defence 07/02/1999, supervision Marzouki, Meryem (1999)
  • P. Bukovjan, M. Marzouki, W. Maroufi : “Design for Testability Reuse in Synthesis for Testability”, XII Symposium on Integrated Circuits and Systems Design (SBCCI'99), Natal, RN, Brazil, pp. 206-209, (IEEE) (1999)
  • P. Bukovjan, M. Marzouki, W. Maroufi : “Testability Analysis and Cost/Quality Trade-off in Synthesis for Testability”, 4^th IEEE European Test Workshop (ETW'99), Constance, Germany (1999)
  • P. Bukovjan, M. Marzouki, W. Maroufi : “Testability Analysis in High-Level Synthesis”, 10^th European Workshop on Dependable Computing (EWDC), Vienna, Austria (1999)
• 1998
  • W. Maroufi, M. Marzouki : “System Testability Evaluation with STA”, 10^th International Conference on Microelectronics (ICM'98), Monastir, Tunisia, pp. 79-81, (IEEE) (1998)
  • P. Bukovjan, M. Marzouki, W. Maroufi : “Cost/Quality Trade-off in High-Level Synthesis for Testability”, 2^nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems, Szczyrk, Poland (1998)
  • P. Bukovjan, M. Marzouki, W. Maroufi : “Allocation for Testability in High-Level Synthesis Process”, 5^th Electronic Devices and Systems Conference, Brno, Czechia (1998)
  • W. Maroufi, M. Marzouki : “STA : A System Testability Assistant”, 3^rd IEEE European Test Workshop, Sitges, Spain (1998)
• 1997
  • W. Maroufi, M. Marzouki : “Specification and Early Evaluation of System Testability through Object Oriented modeling”, 2^nd IEEE European Test Workshop, Cagliari, Italy (1997)