| Current teams : | ALMASTY ALSOC APR BD CIAN ComplexNetworks DECISION DELYS LFI MOCAH MoVe NPA PEQUAN PolSys QI RO SMA SYEL |
| Former team : | ACASA |
| Publications CIAN | 2023 | 2024 | Total |
|---|---|---|---|
| Books | 0 | 0 | 0 |
| Edited books | 0 | 0 | 0 |
| Journal articles | 6 | 3 | 9 |
| Book chapters | 1 | 0 | 1 |
| Conference papers | 6 | 5 | 11 |
| Habilitations | 0 | 0 | 0 |
| Thesis | 2 | 1 | 3 |
- D. Galayko, A. Karami, Ph. Basset, E. Blokhina : “Kinetic Energy Harvesting for the IoT: Perspectives and Challenges for the Next Decade”, 2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS), Bordeaux, France, pp. 593-596, (IEEE) [Galayko 2018]
- D. Genius, M.‑M. Louërat, F. Pêcheux, L. Apvrille, Haralampos‑G. Stratigopoulos : “Modeling Heterogeneous Embedded Systems with TTool”, DUHDe 2018 — 5th Workshop on Design Automation for Understanding Hardware Designs, Dresden, Germany [Genius 2018c]
- E. Koskin, D. Galayko, E. Blokhina : “Averaging Techniques for the Analysis of Event Driven Models of All Digital PLLs”, 2018 IEEE International Symposium on Circuits and Systems (ISCAS), Florence, Italy, pp. 1-5, (IEEE) [Koskin 2018b]
- N. Rambaux, D. Galayko, G. Guignan, J. Vaubaillon, L. Lacassagne, Ph. Keckhut, A. Levasseur‑Regourd, A. Hauchecorne, M. Birlan, G. Augarde, S. Barnier, S. Ben Kemmoum, A. Bigot, P. Boisse, M. Capderou, A. Chu, F. Colas, F. DESHOURS, Y. Fargeix, A. Hennequin, Th. Koehler, M. Lumbroso, J.‑F. Mariscal, D. Portela‑Moreira, J. Raffard, J.‑L. Rault, Th. Romera, C. Tob, B. Zanda : “METEORIX: a cubesat mission dedicated to the detection of meteors”, COSPAR 2018, 42nd Assembly, Pasadena, United States [Rambaux 2018]
- N. Shimizu, J. Akita, M.‑M. Louërat, Haralampos‑G. Stratigopoulos, J.‑P. Chaput, D. Galayko : “Open Source Hardware and EDA Tools for Analog/Mixed-Signal Design and Prototyping”, 2018 IEEE International Symposium on Circuits and Systems (ISCAS), Florence, Italy, (IEEE) [Shimizu 2018]
- Haralampos‑G. Stratigopoulos : “Machine learning applications in IC testing”, 2018 IEEE European Test Symposium (ETS), Bremen, Germany, pp. 1-10, (IEEE) [Stratigopoulos 2018]