Diagnostique de fautes matérielles dans les circuits analogiques

2020-2021 Publications

• 2021
  • A. Pavlidis, E. Faehn, M.‑M. Louërat, Haralampos‑G. Stratigopoulos : “BIST-Assisted Analog Fault Diagnosis”, 26^th IEEE European Test Symposium, Bruges (virtual), Belgium (2021)
  • A. Pavlidis, M.‑M. Louërat, E. Faehn, A. Kumar, Haralampos‑G. Stratigopoulos : “SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety”, IEEE Transactions on Circuits and Systems I: Regular Papers, (IEEE) (2021)
• 2020
  • S. El‑Sayed, Th. Spyrou, A. Pavlidis, E. Afacan, L. Camuñas‑Mesa, B. Linares‑Barranco, Haralampos‑G. Stratigopoulos : “Spiking Neuron Hardware-Level Fault Modeling”, 2020 IEEE 26^th International Symposium on On-Line Testing and Robust System Design (IOLTS), Naples, Italy (2020)
  • M. Elshamy, G. Di Natale, A. Pavlidis, M.‑M. Louërat, Haralampos‑G. Stratigopoulos : “Hardware Trojan Attacks in Analog/Mixed-Signal ICs via the Test Access Mechanism”, 2020 IEEE European Test Symposium (ETS), Tallinn, Estonia (2020)
  • A. Pavlidis, M.‑M. Louërat, E. Faehn, A. Kumar, Haralampos‑G. Stratigopoulos : “Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP”, 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), Grenoble, France (2020)
  • A. Pavlidis, M.‑M. Louërat, E. Faehn, A. Kumar, Haralampos‑G. Stratigopoulos : “SymBIST: Symmetry-based Analog/Mixed-Signal BIST”, 32. GI / GMM / ITG - Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, Ludwigsburg, Germany (2020)