Diagnostique de fautes matérielles dans les circuits analogiques

2020 Publications

• 2020
  • S. El‑Sayed, Th. Spyrou, A. Pavlidis, E. Afacan, L. Camuñas‑Mesa, B. Linares‑Barranco, Haralampos‑G. Stratigopoulos : “Spiking Neuron Hardware-Level Fault Modeling”, 26^th IEEE International Symposium on On-Line Testing and Robust System Design, Naples, Italy (2020)
  • M. Elshamy, G. Di Natale, A. Pavlidis, M.‑M. Louërat, Haralampos‑G. Stratigopoulos : “Hardware Trojan Attacks in Analog/Mixed-Signal ICs via the Test Access Mechanism”, IEEE European Test Symposium, Tallinn, Estonia (2020)
  • A. Pavlidis, M.‑M. Louërat, E. Faehn, A. Kumar, Haralampos‑G. Stratigopoulos : “Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP”, Design, Automation and Test in Europe Conference, Grenoble, France (2020)
  • A. Pavlidis, M.‑M. Louërat, E. Faehn, A. Kumar, Haralampos‑G. Stratigopoulos : “SymBIST: Symmetry-based Analog/Mixed-Signal BIST”, 32. GI / GMM / ITG - Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, Ludwigsburg, Germany (2020)